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Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics (10))
| Full title: | Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics (10)) |
|---|---|
| ISBN: | 9783319998244 |
| ISBN 10: | 3319998242 |
| Authors: | Breitenstein, Otwin Warta, Wilhelm Schubert, Martin C. |
| Publisher: | Springer |
| Edition: | 3rd ed. 2018 |
| Num. pages: | 342 |
| Binding: | Hardcover |
| Language: | en_US |
| Published on: | 2019-01-22T00:00:01Z |
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