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Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)

Full title: Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization (Materials Characterization and Analysis Collection)
ISBN: 9781606507278
ISBN 10: 1606507273
Authors: Harland G. Tompkins James N. Hilfiker
Publisher: Momentum Press
Num. pages: 178
Binding: Paperback
Language: en
Published on: 2015

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